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Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films.

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Bibliographic Details
Title: Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films.
Authors: Ang, C. H., Ling, C. H., Cheng, Z. Y.
Source: Journal of the Electrochemical Society; December 2000, Vol. 147 Issue 12, p4676-4682, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500659056
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Ang%2C+C%2E+H%2E%22">Ang, C. H.</searchLink><br /><searchLink fieldCode="AU" term="%22Ling%2C+C%2E+H%2E%22">Ling, C. H.</searchLink><br /><searchLink fieldCode="AU" term="%22Cheng%2C+Z%2E+Y%2E%22">Cheng, Z. Y.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+Electrochemical+Society%22">Journal of the Electrochemical Society</searchLink>; December 2000, Vol. 147 Issue 12, p4676-4682, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500659056
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1149/1.1394122
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 4676
    Titles:
      – TitleFull: Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ang, C. H.
      – PersonEntity:
          Name:
            NameFull: Ling, C. H.
      – PersonEntity:
          Name:
            NameFull: Cheng, Z. Y.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: December 2000
              Type: published
              Y: 2000
          Identifiers:
            – Type: issn-print
              Value: 00134651
          Numbering:
            – Type: volume
              Value: 147
            – Type: issue
              Value: 12
          Titles:
            – TitleFull: Journal of the Electrochemical Society
              Type: main
ResultId 1