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Investigation of defects in deposited oxides with a frequency resolved capacitance technique.

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Bibliographic Details
Title: Investigation of defects in deposited oxides with a frequency resolved capacitance technique.
Authors: Caputo, Domenico, Irrera, Fernanda, Palma, Fabrizio
Source: IEEE Transactions on Electron Devices; October 2001, Vol. 48 Issue 10, p2342-2347, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500815683
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Investigation of defects in deposited oxides with a frequency resolved capacitance technique.
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  Data: <searchLink fieldCode="AU" term="%22Caputo%2C+Domenico%22">Caputo, Domenico</searchLink><br /><searchLink fieldCode="AU" term="%22Irrera%2C+Fernanda%22">Irrera, Fernanda</searchLink><br /><searchLink fieldCode="AU" term="%22Palma%2C+Fabrizio%22">Palma, Fabrizio</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; October 2001, Vol. 48 Issue 10, p2342-2347, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500815683
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/16.954475
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 2342
    Titles:
      – TitleFull: Investigation of defects in deposited oxides with a frequency resolved capacitance technique.
        Type: main
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          Name:
            NameFull: Caputo, Domenico
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            NameFull: Irrera, Fernanda
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            NameFull: Palma, Fabrizio
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            – D: 01
              M: 10
              Text: October 2001
              Type: published
              Y: 2001
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              Value: 00189383
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              Value: 48
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              Value: 10
          Titles:
            – TitleFull: IEEE Transactions on Electron Devices
              Type: main
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