The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing.
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| Title: | The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing. |
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| Authors: | Filippi, R. G., Wachnik, R. A., Eng, C-P. |
| Source: | Journal of Applied Physics; May 1 2002, Vol. 91 Issue 9, p5787-5795, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1459616 |
