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The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing.

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Title: The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing.
Authors: Filippi, R. G., Wachnik, R. A., Eng, C-P.
Source: Journal of Applied Physics; May 1 2002, Vol. 91 Issue 9, p5787-5795, 9p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500865194
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; May 1 2002, Vol. 91 Issue 9, p5787-5795, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500865194
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      – Type: doi
        Value: 10.1063/1.1459616
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 5787
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      – TitleFull: The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing.
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            NameFull: Filippi, R. G.
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            NameFull: Wachnik, R. A.
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            NameFull: Eng, C-P.
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            – D: 01
              M: 05
              Text: May 1 2002
              Type: published
              Y: 2002
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              Value: 91
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              Value: 9
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