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Silicon self-diffusivity measurement in thermal SiO2 by 30Si/28Si isotopic exchange.

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Bibliographic Details
Title: Silicon self-diffusivity measurement in thermal SiO2 by 30Si/28Si isotopic exchange.
Authors: Mathiot, D., Schunck, J. P., Perego, M.
Source: Journal of Applied Physics; August 1 2003, Vol. 94 Issue 3, p2136-2138, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500875319
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Silicon self-diffusivity measurement in thermal SiO2 by 30Si/28Si isotopic exchange.
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  Data: <searchLink fieldCode="AU" term="%22Mathiot%2C+D%2E%22">Mathiot, D.</searchLink><br /><searchLink fieldCode="AU" term="%22Schunck%2C+J%2E+P%2E%22">Schunck, J. P.</searchLink><br /><searchLink fieldCode="AU" term="%22Perego%2C+M%2E%22">Perego, M.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; August 1 2003, Vol. 94 Issue 3, p2136-2138, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500875319
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.1589168
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 2136
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      – TitleFull: Silicon self-diffusivity measurement in thermal SiO2 by 30Si/28Si isotopic exchange.
        Type: main
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            NameFull: Mathiot, D.
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            NameFull: Schunck, J. P.
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            NameFull: Perego, M.
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            – D: 01
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              Text: August 1 2003
              Type: published
              Y: 2003
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              Value: 94
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