X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.

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Bibliographic Details
Title:	X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.
Authors:	Stokes, D. W., Forrest, R. L., Li, J. H.
Source:	IEE Proceedings -- Optoelectronics; August 2003, Vol. 150 Issue 4, p420-423, 4p
Database:	Applied Science & Technology Source

Description
ISSN:	13502433
DOI:	10.1049/ip-opt:20030643