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X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.

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Bibliographic Details
Title: X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.
Authors: Stokes, D. W., Forrest, R. L., Li, J. H.
Source: IEE Proceedings -- Optoelectronics; August 2003, Vol. 150 Issue 4, p420-423, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500876796
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PubType: Academic Journal
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  Data: X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.
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  Data: <searchLink fieldCode="AU" term="%22Stokes%2C+D%2E+W%2E%22">Stokes, D. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Forrest%2C+R%2E+L%2E%22">Forrest, R. L.</searchLink><br /><searchLink fieldCode="AU" term="%22Li%2C+J%2E+H%2E%22">Li, J. H.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEE+Proceedings+--+Optoelectronics%22">IEE Proceedings -- Optoelectronics</searchLink>; August 2003, Vol. 150 Issue 4, p420-423, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500876796
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        Value: 10.1049/ip-opt:20030643
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 420
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      – TitleFull: X-ray diffraction analysis of lateral composition modulation in InAs/GaSb superlattices intended for infrared detector applications.
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            NameFull: Stokes, D. W.
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            NameFull: Forrest, R. L.
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            NameFull: Li, J. H.
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              Text: August 2003
              Type: published
              Y: 2003
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            – TitleFull: IEE Proceedings -- Optoelectronics
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