Analysing trade-offs in scan power and test data compression for systems-on-a-chip.
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| Title: | Analysing trade-offs in scan power and test data compression for systems-on-a-chip. |
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| Authors: | Rosinger, P. M., Gonciari, P. T., Al-Hashimi, B. M. |
| Source: | IEE Proceedings -- Computers & Digital Techniques; July 2002, Vol. 149 Issue 4, p188-196, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 13502387 |
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| DOI: | 10.1049/ip-cdt:20020450 |
