APA (7th ed.) Citation

Rosinger, P. M., Gonciari, P. T., & Al-Hashimi, B. M. (2002). Analysing trade-offs in scan power and test data compression for systems-on-a-chip. IEE Proceedings -- Computers & Digital Techniques, 149(4), 188. https://doi.org/10.1049/ip-cdt:20020450

Chicago Style (17th ed.) Citation

Rosinger, P. M., P. T. Gonciari, and B. M. Al-Hashimi. "Analysing Trade-offs in Scan Power and Test Data Compression for Systems-on-a-chip." IEE Proceedings -- Computers & Digital Techniques 149, no. 4 (2002): 188. https://doi.org/10.1049/ip-cdt:20020450.

MLA (9th ed.) Citation

Rosinger, P. M., et al. "Analysing Trade-offs in Scan Power and Test Data Compression for Systems-on-a-chip." IEE Proceedings -- Computers & Digital Techniques, vol. 149, no. 4, 2002, p. 188, https://doi.org/10.1049/ip-cdt:20020450.