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Analysing trade-offs in scan power and test data compression for systems-on-a-chip.

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Title: Analysing trade-offs in scan power and test data compression for systems-on-a-chip.
Authors: Rosinger, P. M., Gonciari, P. T., Al-Hashimi, B. M.
Source: IEE Proceedings -- Computers & Digital Techniques; July 2002, Vol. 149 Issue 4, p188-196, 9p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500893782
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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        Value: 10.1049/ip-cdt:20020450
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      – Code: eng
        Text: English
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        PageCount: 9
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      – TitleFull: Analysing trade-offs in scan power and test data compression for systems-on-a-chip.
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              Text: July 2002
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              Y: 2002
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