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Analysing trade-offs in scan power and test data compression for systems-on-a-chip.

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Bibliographic Details
Title: Analysing trade-offs in scan power and test data compression for systems-on-a-chip.
Authors: Rosinger, P. M., Gonciari, P. T., Al-Hashimi, B. M.
Source: IEE Proceedings -- Computers & Digital Techniques; July 2002, Vol. 149 Issue 4, p188-196, 9p
Database: Applied Science & Technology Source
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