A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques.
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| Title: | A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques. |
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| Authors: | Iñiguez, Benjamin, Raskin, Jean-Pierre, Simon, Pascal |
| Source: | Solid-State Electronics; November 2003, Vol. 47 Issue 11, p1959-1967, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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| DOI: | 10.1016/S0038-1101(03)00249-1 |
