Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
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| Title: | Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001) |
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| Authors: | Cook, T. E. Jr, Fulton, C. C., Mecouch, W. J. |
| Source: | Journal of Applied Physics; April 1 2003, Vol. 93 Issue 7, p3995-4004, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1559424 |
