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Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.

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Bibliographic Details
Title: Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.
Authors: Fang, Te-Hua, Jian, Sheng-Rui, Chuu, Der-San
Source: Journal of Physics: D Applied Physics; April 7 2003, Vol. 36 Issue 7, p878-883, 6p
Database: Applied Science & Technology Source
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