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Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits.

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Bibliographic Details
Title:	Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits.
Authors:	Suñe, Jordi, Wu, Ernst Y., Lai, Wing L.
Source:	IEEE Transactions on Electron Devices; Oct2004, Vol. 51 Issue 10, p1584-1592, 9p
Database:	Applied Science & Technology Source

Description
ISSN:	00189383
DOI:	10.1109/TED.2004.835986