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Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits.

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Title: Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits.
Authors: Suñe, Jordi, Wu, Ernst Y., Lai, Wing L.
Source: IEEE Transactions on Electron Devices; Oct2004, Vol. 51 Issue 10, p1584-1592, 9p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1109/TED.2004.835986
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        Text: English
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