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Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.

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Bibliographic Details
Title: Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.
Authors: Takeuchi, I., Long, C. J., Famodu, O. O.
Source: Review of Scientific Instruments; June 2005, Vol. 76 Issue 6, p062223-062223, 1p
Database: Applied Science & Technology Source
Description
ISSN:00346748
DOI:10.1063/1.1927079