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Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.

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Title: Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.
Authors: Takeuchi, I., Long, C. J., Famodu, O. O.
Source: Review of Scientific Instruments; June 2005, Vol. 76 Issue 6, p062223-062223, 1p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1063/1.1927079
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      – Code: eng
        Text: English
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        PageCount: 1
        StartPage: 062223
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      – TitleFull: Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.
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            NameFull: Takeuchi, I.
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            NameFull: Famodu, O. O.
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              Text: June 2005
              Type: published
              Y: 2005
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              Value: 76
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