Measuring the specific contact resistance of contacts to semiconductor nanowires.
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| Title: | Measuring the specific contact resistance of contacts to semiconductor nanowires. |
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| Authors: | Mohney, S. E., Wang, Y., Cabassi, M. A. |
| Source: | Solid-State Electronics; February 2005, Vol. 49 Issue 2, p227-232, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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| DOI: | 10.1016/j.sse.2004.08.006 |
