APA (7th ed.) Citation

Mohney, S. E., Wang, Y., & Cabassi, M. A. (2005). Measuring the specific contact resistance of contacts to semiconductor nanowires. Solid-State Electronics, 49(2), 227. https://doi.org/10.1016/j.sse.2004.08.006

Chicago Style (17th ed.) Citation

Mohney, S. E., Y. Wang, and M. A. Cabassi. "Measuring the Specific Contact Resistance of Contacts to Semiconductor Nanowires." Solid-State Electronics 49, no. 2 (2005): 227. https://doi.org/10.1016/j.sse.2004.08.006.

MLA (9th ed.) Citation

Mohney, S. E., et al. "Measuring the Specific Contact Resistance of Contacts to Semiconductor Nanowires." Solid-State Electronics, vol. 49, no. 2, 2005, p. 227, https://doi.org/10.1016/j.sse.2004.08.006.

Warning: These citations may not always be 100% accurate.