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Measuring the specific contact resistance of contacts to semiconductor nanowires.

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Bibliographic Details
Title: Measuring the specific contact resistance of contacts to semiconductor nanowires.
Authors: Mohney, S. E., Wang, Y., Cabassi, M. A.
Source: Solid-State Electronics; February 2005, Vol. 49 Issue 2, p227-232, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501089919
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Solid-State+Electronics%22">Solid-State Electronics</searchLink>; February 2005, Vol. 49 Issue 2, p227-232, 6p
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.sse.2004.08.006
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 227
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      – TitleFull: Measuring the specific contact resistance of contacts to semiconductor nanowires.
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            NameFull: Mohney, S. E.
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            NameFull: Wang, Y.
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            NameFull: Cabassi, M. A.
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              Text: February 2005
              Type: published
              Y: 2005
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