Simultaneous microRaman and synchrotron radiation microdiffraction: Tools for materials characterization.
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| Title: | Simultaneous microRaman and synchrotron radiation microdiffraction: Tools for materials characterization. |
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| Authors: | Davies, R. J., Burghammer, M., Riekel, C. |
| Source: | Applied Physics Letters; December 26 2005, Vol. 87 Issue 26, p264105-264105, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.2159087 |
