Integrating intrinsic parameter fluctuation description into BSIMSOI to forecast sub-15 nm UTB SOI based 6T SRAM operation.

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Bibliographic Details
Title: Integrating intrinsic parameter fluctuation description into BSIMSOI to forecast sub-15 nm UTB SOI based 6T SRAM operation.
Authors: Samsudin, K., Cheng, B., Brown, A. R.
Source: Solid-State Electronics; January 2006, Vol. 50 Issue 1, p86-93, 8p
Database: Applied Science & Technology Source
Description
ISSN:00381101
DOI:10.1016/j.sse.2005.10.048