Electrical Characterization of n-Type Polycrystalline 3C-Silicon Carbide Thin Films Deposited by 1,3-Disilabutane.
Saved in:
| Title: | Electrical Characterization of n-Type Polycrystalline 3C-Silicon Carbide Thin Films Deposited by 1,3-Disilabutane. |
|---|---|
| Authors: | Zhang, Jingchun, Howe, Roger T., Maboudian, Roya |
| Source: | Journal of the Electrochemical Society; 2006, Vol. 153 Issue 6, pG548-G551, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00134651 |
|---|---|
| DOI: | 10.1149/1.2188327 |