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The Quantization Impact of Accumulated Carriers in Silicide-Gated MOSFETs.

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Bibliographic Details
Title:	The Quantization Impact of Accumulated Carriers in Silicide-Gated MOSFETs.
Authors:	Rodriguez, Noel, Gámiz, Francisco, Clerc, Raphael
Source:	IEEE Electron Device Letters; June 2008, Vol. 29 Issue 6, p628-631, 4p
Database:	Applied Science & Technology Source

Description
ISSN:	07413106
DOI:	10.1109/LED.2008.921209