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Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines.

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Bibliographic Details
Title: Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines.
Authors: Sun, Zhigang, Wang, Jiabin, Howe, David
Source: IEEE Transactions on Industrial Electronics; December 2008, Vol. 55 Issue 12, p4210-4217, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501354546
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines.
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  Data: <searchLink fieldCode="AU" term="%22Sun%2C+Zhigang%22">Sun, Zhigang</searchLink><br /><searchLink fieldCode="AU" term="%22Wang%2C+Jiabin%22">Wang, Jiabin</searchLink><br /><searchLink fieldCode="AU" term="%22Howe%2C+David%22">Howe, David</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Industrial+Electronics%22">IEEE Transactions on Industrial Electronics</searchLink>; December 2008, Vol. 55 Issue 12, p4210-4217, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501354546
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TIE.2008.2005019
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 4210
    Titles:
      – TitleFull: Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines.
        Type: main
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          Name:
            NameFull: Sun, Zhigang
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            NameFull: Wang, Jiabin
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            NameFull: Howe, David
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            – D: 01
              M: 12
              Text: December 2008
              Type: published
              Y: 2008
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              Value: 55
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              Value: 12
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            – TitleFull: IEEE Transactions on Industrial Electronics
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