Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip.

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Bibliographic Details
Title: Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip.
Authors: George, Kiran, Chen, Chien-In Henry
Source: IEEE Transactions on Instrumentation & Measurement; May 2009, Vol. 58 Issue 5, p1495-1504, 10p
Database: Applied Science & Technology Source
Description
ISSN:00189456
DOI:10.1109/TIM.2008.2009417