Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip.
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| Title: | Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip. |
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| Authors: | George, Kiran, Chen, Chien-In Henry |
| Source: | IEEE Transactions on Instrumentation & Measurement; May 2009, Vol. 58 Issue 5, p1495-1504, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189456 |
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| DOI: | 10.1109/TIM.2008.2009417 |