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Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films.

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Bibliographic Details
Title: Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films.
Authors: Chien, Chi-Hui, Jian, Sheng-Rui, Wang, Chung-Ting
Source: Journal of Physics: D Applied Physics; July 7 2007, Vol. 40 Issue 13, p3985-3990, 6p
Database: Applied Science & Technology Source
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