Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films.
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| Title: | Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films. |
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| Authors: | Chien, Chi-Hui, Jian, Sheng-Rui, Wang, Chung-Ting |
| Source: | Journal of Physics: D Applied Physics; July 7 2007, Vol. 40 Issue 13, p3985-3990, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00223727 |
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| DOI: | 10.1088/0022-3727/40/13/011 |
