Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination.

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Bibliographic Details
Title: Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination.
Authors: Styk, Adam, Patorski, Krzysztof
Source: Applied Optics; July 20 2007, Vol. 46 Issue 21, p4613-4624, 12p
Database: Applied Science & Technology Source
Description
ISSN:00036935
DOI:10.1364/AO.46.004613