Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters.
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| Title: | Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. |
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| Authors: | Wibbenmeyer, Jason, Chen, Chien-In Henry |
| Source: | IEEE Transactions on Instrumentation & Measurement; December 2007, Vol. 56 Issue 6, p2748-2756, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189456 |
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| DOI: | 10.1109/TIM.2007.908343 |
