Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters.
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| Title: | Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. |
|---|---|
| Authors: | Wibbenmeyer, Jason, Chen, Chien-In Henry |
| Source: | IEEE Transactions on Instrumentation & Measurement; December 2007, Vol. 56 Issue 6, p2748-2756, 9p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501520916 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501520916 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TIM.2007.908343 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 2748 Titles: – TitleFull: Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wibbenmeyer, Jason – PersonEntity: Name: NameFull: Chen, Chien-In Henry IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: December 2007 Type: published Y: 2007 Identifiers: – Type: issn-print Value: 00189456 Numbering: – Type: volume Value: 56 – Type: issue Value: 6 Titles: – TitleFull: IEEE Transactions on Instrumentation & Measurement Type: main |
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