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Hole Mobility in Ultrathin Double-Gate SOI Devices: The Effect of Acoustic Phonon Confinement.

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Bibliographic Details
Title: Hole Mobility in Ultrathin Double-Gate SOI Devices: The Effect of Acoustic Phonon Confinement.
Authors: Donetti, Luca, Gamiz, Francisco, Rodriguez, Noel
Source: IEEE Electron Device Letters; December 2009, Vol. 30 Issue 12, p1338-1340, 3p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501535394
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Hole Mobility in Ultrathin Double-Gate SOI Devices: The Effect of Acoustic Phonon Confinement.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Donetti%2C+Luca%22">Donetti, Luca</searchLink><br /><searchLink fieldCode="AU" term="%22Gamiz%2C+Francisco%22">Gamiz, Francisco</searchLink><br /><searchLink fieldCode="AU" term="%22Rodriguez%2C+Noel%22">Rodriguez, Noel</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; December 2009, Vol. 30 Issue 12, p1338-1340, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501535394
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/LED.2009.2032568
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 1338
    Titles:
      – TitleFull: Hole Mobility in Ultrathin Double-Gate SOI Devices: The Effect of Acoustic Phonon Confinement.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Donetti, Luca
      – PersonEntity:
          Name:
            NameFull: Gamiz, Francisco
      – PersonEntity:
          Name:
            NameFull: Rodriguez, Noel
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: December 2009
              Type: published
              Y: 2009
          Identifiers:
            – Type: issn-print
              Value: 07413106
          Numbering:
            – Type: volume
              Value: 30
            – Type: issue
              Value: 12
          Titles:
            – TitleFull: IEEE Electron Device Letters
              Type: main
ResultId 1