Charge storage characteristics of high density Mo nanocrystal embedded in silicon oxide and silicon nitride.

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Bibliographic Details
Title: Charge storage characteristics of high density Mo nanocrystal embedded in silicon oxide and silicon nitride.
Authors: Lin, Chao-Cheng, Chang, Ting-Chang, Tu, Chun-Hao
Source: Journal of Physics: D Applied Physics; February 24 2010, Vol. 43 Issue 7, p075106-1-075106-4, 4p
Database: Applied Science & Technology Source
Description
ISSN:00223727
DOI:10.1088/0022-3727/43/7/075106