View in EDS PDF Full Text

Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects.

Saved in:
Bibliographic Details
Title: Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects.
Authors: Fu, B., Ampadu, P.
Source: IET Computers & Digital Techniques; May 2010, Vol. 4 Issue 3, p251-261, 11p
Database: Applied Science & Technology Source
Description
ISSN:17518601
DOI:10.1049/iet-cdt.2008.0130