Analysis of mechanism for resonant tunneling via localized states in thin SiO2 films.
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| Title: | Analysis of mechanism for resonant tunneling via localized states in thin SiO2 films. |
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| Authors: | Gu, B., Mangiantini, M., Coluzza, C. |
| Source: | Journal of Applied Physics; December 15 1988, Vol. 64, p6867-6870, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.341980 |
