Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
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| Title: | Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition. |
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| Authors: | Feng, Z. C., Sudharsanan, R., Perkowitz, S. |
| Source: | Journal of Applied Physics; December 15 1988, Vol. 64, p6861-6863, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.341977 |
