Effects of annealing temperature on microstructure and electrical and optical properties of radio-frequency-sputtered tin-doped indium oxide films.
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| Title: | Effects of annealing temperature on microstructure and electrical and optical properties of radio-frequency-sputtered tin-doped indium oxide films. |
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| Authors: | Na, Jong-Gab, Cho, Young-Rae, Kim, Young-Ho |
| Source: | Journal of the American Ceramic Society; April 1989, Vol. 72, p698-701, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00027820 |
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| DOI: | 10.1111/j.1151-2916.1989.tb06201.x |
