Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.

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Bibliographic Details
Title:	Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.
Authors:	Tseng, W.-D., Lee, L.-J., Lin, R.-B.
Source:	IET Computers & Digital Techniques; July 2010, Vol. 4 Issue 4, p317-324, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	17518601
DOI:	10.1049/iet-cdt.2009.0092