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Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.

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Title: Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.
Authors: Tseng, W.-D., Lee, L.-J., Lin, R.-B.
Source: IET Computers & Digital Techniques; July 2010, Vol. 4 Issue 4, p317-324, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501639423
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PubType: Academic Journal
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      – Type: doi
        Value: 10.1049/iet-cdt.2009.0092
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 317
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      – TitleFull: Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.
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            NameFull: Tseng, W.-D.
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            NameFull: Lee, L.-J.
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              Text: July 2010
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              Y: 2010
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