Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.
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| Title: | Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices. |
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| Authors: | El-Deeb, W. S., Hashmi, M. S., Smida, S. B. |
| Source: | IET Microwaves, Antennas & Propagation; November 2010, Vol. 4 Issue 11, p1773-1781, 9p |
| Database: | Applied Science & Technology Source |
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