Titanium-related deep levels in silicon: a reexamination.
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| Title: | Titanium-related deep levels in silicon: a reexamination. |
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| Authors: | Mathiot, D., Hocine, S. |
| Source: | Journal of Applied Physics; December 15 1989, Vol. 66, p5862-5867, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.343608 |
