The development of ultra-high-frequency VLSI device test systems.
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| Title: | The development of ultra-high-frequency VLSI device test systems. |
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| Authors: | Rodriquez, C. W., Hoffman, D. E. |
| Source: | IBM Journal of Research & Development; March-May 1990, Vol. 34, p260-275, 16p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00188646 |
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| DOI: | 10.1147/rd.342.0260 |
