The development of ultra-high-frequency VLSI device test systems.
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| Title: | The development of ultra-high-frequency VLSI device test systems. |
|---|---|
| Authors: | Rodriquez, C. W., Hoffman, D. E. |
| Source: | IBM Journal of Research & Development; March-May 1990, Vol. 34, p260-275, 16p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501733601 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The development of ultra-high-frequency VLSI device test systems. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Rodriquez%2C+C%2E+W%2E%22">Rodriquez, C. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Hoffman%2C+D%2E+E%2E%22">Hoffman, D. E.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IBM+Journal+of+Research+%26+Development%22">IBM Journal of Research & Development</searchLink>; March-May 1990, Vol. 34, p260-275, 16p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501733601 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1147/rd.342.0260 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 16 StartPage: 260 Titles: – TitleFull: The development of ultra-high-frequency VLSI device test systems. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Rodriquez, C. W. – PersonEntity: Name: NameFull: Hoffman, D. E. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: March-May 1990 Type: published Y: 1990 Identifiers: – Type: issn-print Value: 00188646 Numbering: – Type: volume Value: 34 Titles: – TitleFull: IBM Journal of Research & Development Type: main |
| ResultId | 1 |