The development of ultra-high-frequency VLSI device test systems.

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Bibliographic Details
Title: The development of ultra-high-frequency VLSI device test systems.
Authors: Rodriquez, C. W., Hoffman, D. E.
Source: IBM Journal of Research & Development; March-May 1990, Vol. 34, p260-275, 16p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501733601
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501733601
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1147/rd.342.0260
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 260
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      – TitleFull: The development of ultra-high-frequency VLSI device test systems.
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            NameFull: Rodriquez, C. W.
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            NameFull: Hoffman, D. E.
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              M: 03
              Text: March-May 1990
              Type: published
              Y: 1990
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              Value: 00188646
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              Value: 34
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