Low-temperature in situ surface cleaning of oxide-patterned wafers by Ar/H2 plasma sputter.

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Bibliographic Details
Title: Low-temperature in situ surface cleaning of oxide-patterned wafers by Ar/H2 plasma sputter.
Authors: Yew, Tri-Rung, Reif, Rafael
Source: Journal of Applied Physics; November 1 1990, Vol. 68, p4681-4693, 13p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.346180