Scheme for designing concurrent checking and easily testable PLAs.
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| Title: | Scheme for designing concurrent checking and easily testable PLAs. |
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| Authors: | Tao, D. L., Lala, P. K., Hartmann, C. R. P. |
| Source: | IEE Proceedings. Part E, Computers & Digital Techniques.; November 1990, Vol. 137, p442-450, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 01437062 |
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| DOI: | 10.1049/ip-e.1990.0056 |
