APA (7th ed.) Citation

Tao, D. L., Lala, P. K., & Hartmann, C. R. P. (1990). Scheme for designing concurrent checking and easily testable PLAs. IEE Proceedings. Part E, Computers & Digital Techniques., 137, 442. https://doi.org/10.1049/ip-e.1990.0056

Chicago Style (17th ed.) Citation

Tao, D. L., P. K. Lala, and C. R. P. Hartmann. "Scheme for Designing Concurrent Checking and Easily Testable PLAs." IEE Proceedings. Part E, Computers & Digital Techniques. 137 (1990): 442. https://doi.org/10.1049/ip-e.1990.0056.

MLA (9th ed.) Citation

Tao, D. L., et al. "Scheme for Designing Concurrent Checking and Easily Testable PLAs." IEE Proceedings. Part E, Computers & Digital Techniques., vol. 137, 1990, p. 442, https://doi.org/10.1049/ip-e.1990.0056.