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Scheme for designing concurrent checking and easily testable PLAs.

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Bibliographic Details
Title: Scheme for designing concurrent checking and easily testable PLAs.
Authors: Tao, D. L., Lala, P. K., Hartmann, C. R. P.
Source: IEE Proceedings. Part E, Computers & Digital Techniques.; November 1990, Vol. 137, p442-450, 9p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501804979
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Scheme for designing concurrent checking and easily testable PLAs.
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1049/ip-e.1990.0056
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 442
    Titles:
      – TitleFull: Scheme for designing concurrent checking and easily testable PLAs.
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            NameFull: Tao, D. L.
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            NameFull: Lala, P. K.
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            NameFull: Hartmann, C. R. P.
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            – D: 01
              M: 11
              Text: November 1990
              Type: published
              Y: 1990
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              Value: 01437062
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              Value: 137
          Titles:
            – TitleFull: IEE Proceedings. Part E, Computers & Digital Techniques.
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