Laser-induced damage to silicon charge-coupled imaging devices.

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Bibliographic Details
Title: Laser-induced damage to silicon charge-coupled imaging devices.
Authors: Zhang, Chenzhi, Watkins, Steve E., Walser, Rodger M.
Source: Optical Engineering; May 1991, Vol. 30, p651-657, 7p
Database: Applied Science & Technology Source
Description
ISSN:00913286