Enhanced effects with scanning force microscopy.
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| Title: | Enhanced effects with scanning force microscopy. |
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| Authors: | Howells, S., Chen, T., Gallagher, M. |
| Source: | Journal of Applied Physics; May 15 1991, Vol. 69, p7330-7332, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.347586 |
